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针对不同牌号的无取向硅钢产生结疤缺陷的难易程度和表面结疤缺陷的外形特征及分布规律,分析了该缺陷产生的原因。通过调整剪前导板的对中度,设置精轧侧导板开度余量及短行程数值,及时修补与更换侧导板,减少带坯与侧导板挤撞程度,有效地降低了结疤缺陷发生率。 This article analyses the cause of the scab defects according to the defects appearance characters and distribution law,degree of difficulty to form scar of non-oriented silicon steel. It can effectively decrease the scabs by different methods,such as adjusting the center line of guide plate,setting the opening margin and short stroke value of the side guide on finishing mill,timely repairing and replacing of side guide,decreasing the collision between the strip and side guide. 
2014-03-28 143 5.8

介绍了CSP工艺生产无取向电工钢各工序的设备特点、采用的工艺控制手段和电工钢产品质量情况,结合生产实践证明了马钢CSP工艺开发的无取向电工钢产品丰富了薄板坯连铸连轧的品种结构,发挥了薄板坯连铸连轧生产无取向电工钢性能均一、稳定的特点。 The equipment characteristic,the process control method and the quality of non-orientated silicon steel by CSP process were introduced.Combined with the production situation,it is proved that production of non-orientated silicon steel developed on Masteel CSP line would enrich product structure of thin slab continuous casting and rolling,and it exerts stable performance of non-orientated silicon steel. 
2013-06-28 151 5.8

采用双辊连铸工艺制备了硅的质量分数分别为0.5%,1.0%,3.0%,4.5%的硅钢薄带,用光学显微镜观察其组织,并研究了后处理工艺对薄带组织和性能的影响。结果表明:硅含量为0.5%和1.0%的薄带适合采用一次冷轧+850~950℃退火的后处理工艺,而硅含量在3.0%以上的薄带适合采用二次冷轧+950℃退火的后处理工艺;硅含量为3.0%和4.5%的薄带在冷轧并950℃退火后,其磁性能最佳,铁芯损耗约为4.30 W·kg-1,磁感应强度约为1.68T。 Silicon steel thin strips with silicon content of 0.5wt%,1.0wt%,3.0wt%and 4.5wt%were prepared by twin-roll continuous casting process,and the microstructure of the strips were observed by means of optical microscopy,and on the basis,the effect of post-treatment process on microstructure and properties of the strips was studied.The results show that the post-treatment process of one-time cold rolling and annealing between 850—950℃was suitable for the strips with silicon content of 0.5wt%and 1.0wt... 
2011-08-28 121 5.8

研究了应用电感耦合等离子体质谱(ICP-MS)同时测定硅钢中痕量铝、钼、钒、钛、铌元素的分析方法。通过条件试验对测量参数进行了优化,确定RF功率1 400 W,泵速30rpm,采样深度140,雾化压力0.90。样品采用硝酸分解,以Be、Y混合内标校正了测量过程中高基体引起的信号漂移。根据测量时存在的质谱干扰情况,选择同位素27 Al、98 Mo、51 V、47 Ti和93 Nb作为测定同位素,同时通过调节仪器参数使得双电荷离子和氧化物离子的产率最低,以减少其带来的干扰。采用基体匹配法配制校准溶液,以标准加入法建立工作曲线,并扣除试剂空白。该方法各元素的测定下限均可达到1μg/g。用于硅钢标准样品的测定,所得结果与参考值完全吻合,各元素的RSD小于5.2%。 A method for the determination of trace aluminum,molybdenum,vanadium,titanium and niobium in silicon steel by inductively coupled plasma mass spectrometry(ICP-MS) was described.A series of single parameter condition experiment was conducted.The optimized operation parameters with RF power 1 400 W,turbo pump rate 30 rpm,sampling depth 140 and nebulizer pressure 0.90 were obtained.The samples were dissolved by HNO3,and the Be and Y mixing internal standard were used to eliminate the signal drift c... 
2013-01-28 147 5.8

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