硅钢资料

运用电子背散射衍射(EBSD)和X射线衍射(XRD)技术对硅钢热轧板的织构在板厚方向的分布进行了研究,并分析了两种织构测量方法的特点。EBSD技术能直观给出板厚方向的微观织构,XRD能得到钢板的宏观统计织构信息,结合两种技术的分析,能更直观更精确的研究不同织构在板厚方向的分布。 The texture distribution along the thickness of the silicon steel has been investigated by electron backscatter diffraction(EBSD) and X-ray diffraction(XRD) technique.The characteristics of two technique of texture analysis have been investigated.Combined the two techniques,the texture distribution along the thickness of the silicon steel could be realized distinctly and accurately. 

介绍了国内无底层取向电工钢生产技术水平、产量和用途，简述了无底层取向电工钢作为取向电工钢超/极薄带母料及应用于制作大型发电机组铁心、风电等电机铁心和变压器铁心等的情况。 The production technology level,output and application of domestic glassless grainoriented electrical steel were introduced,and the application of glassless grain-oriented electrical steel as parent material of ultra-thin strip of grain-oriented electrical steel and in making large-scale electric generator cores,wind power motor cores and transformer cores were briefly described. 

研究了应用电感耦合等离子体质谱(ICP-MS)同时测定硅钢中痕量铝、钼、钒、钛、铌元素的分析方法。通过条件试验对测量参数进行了优化,确定RF功率1 400 W,泵速30rpm,采样深度140,雾化压力0.90。样品采用硝酸分解,以Be、Y混合内标校正了测量过程中高基体引起的信号漂移。根据测量时存在的质谱干扰情况,选择同位素27 Al、98 Mo、51 V、47 Ti和93 Nb作为测定同位素,同时通过调节仪器参数使得双电荷离子和氧化物离子的产率最低,以减少其带来的干扰。采用基体匹配法配制校准溶液,以标准加入法建立工作曲线,并扣除试剂空白。该方法各元素的测定下限均可达到1μg/g。用于硅钢标准样品的测定,所得结果与参考值完全吻合,各元素的RSD小于5.2%。 A method for the determination of trace aluminum,molybdenum,vanadium,titanium and niobium in silicon steel by inductively coupled plasma mass spectrometry(ICP-MS) was described.A series of single parameter condition experiment was conducted.The optimized operation parameters with RF power 1 400 W,turbo pump rate 30 rpm,sampling depth 140 and nebulizer pressure 0.90 were obtained.The samples were dissolved by HNO3,and the Be and Y mixing internal standard were used to eliminate the signal drift c... 

分析了电感耦合等离子体发射光谱法(ICP-AES)测定硅钢中铌的检测过程,讨论了该检测过程中不确定度的主要来源,建立了该方法的定量的数学模型,并根据这一模型计算出了检测结果的合成标准不确定度和扩展不确定度。 The measurement of niobium content in silicon steel by inductively coupled plasma atomic emission spectrometry(ICP-AES) was analyzed,by which the main factors affecting the uncertainty of the measurement were ascertained and the calculation formula was given.Finally,according to the formula the combined uncertainty and expanded uncertainty were obtained.